nikolaos limnios
Advances in Degradation Modeling
DigitalSofort lieferbarWilliam Q. Meeker has made pioneering and phenomenal contributions to the general areaofreliabili...
Applied Nonparametric Statistics in Reliability
DigitalSofort lieferbarNonparametric statistics has probably become the leading methodology for researchers performin...
Semi-Markov Chains and Hidden Semi-Markov Models toward Applications
DigitalSofort lieferbarP Two important types of models for reliability and genetics, the semi-Markov and hidden semi-Ma...
Statistical Models and Methods for Biomedical and Technical Systems
DigitalSofort lieferbarAn outgrowth of the 'International Conference on Statistical Models for Biomedical and Technic...
Stochastic Systems In Merging Phase Space
DigitalSofort lieferbarThis book provides recent results on the stochastic approximation of systems by weak convergence ...
Introduction to Stochastic Models
DigitalSofort lieferbarThis book provides a pedagogical examination of the way in which stochastic models are encountere...
Mathematical Methods in Survival Analysis, Reliability and Quality of Life
DigitalSofort lieferbarReliability and survival analysis are important applications of stochastic mathematics (probabili...
Introduction to Stochastic Models
DigitalSofort lieferbarThis book provides a pedagogical examination of the way in which stochastic models are encountere...
Mathematical Methods in Survival Analysis, Reliability and Quality of Life
DigitalSofort lieferbarReliability and survival analysis are important applications of stochastic mathematics (probabili...
Earthquake Statistical Analysis through Multi-state Modeling
DigitalSofort lieferbarEarthquake occurrence modeling is a rapidly developing research area. This book deals with its...
Modern Stochastics and Applications
DigitalSofort lieferbarThis volume presents an extensive overview of all major modern trends in applications of proba...
Fault Trees
DigitalSofort lieferbarFault tree analysis is an important technique in determining the safety and dependability of comp...