manoj sachdev
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
DigitalSofort lieferbarPSTRONG CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesSTRONGcove...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
DigitalSofort lieferbarPEM ESD Protection Device and Circuit Design for Advanced CMOS TechnologiesEMis intended f...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
DigitalSofort lieferbarDefect-oriented testing methods have come a long way from a mere interesting academic exercise to...
Thermal and Power Management of Integrated Circuits
DigitalSofort lieferbarP In Thermal and Power Management of Integrated Circuits, power and thermal management issues in...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
TaschenbuchPrint on DemandThe 2nd edition of defect oriented testing has been extensively updated. New chapters on Function...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
TaschenbuchPrint on DemandESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
BuchPrint on DemandESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
BuchPrint on DemandInhaltsangabeDedication.- Preface.- Foreword.- Acknowledgments.- 1. Introduction.- 2. Functional ...
Thermal and Power Management of Integrated Circuits
TaschenbuchPrint on DemandInhaltsangabePower, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Te...
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
TaschenbuchPrint on DemandInhaltsangabeForeword. Preface. Acronyms. 1. INTRODUCTION AND MOTIVATION. 1.1 Motivation. 1.2 SRA...
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
BuchBesorgungstitel - wird vorgemerktThe monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologi...
Thermal and Power Management of Integrated Circuits
BuchBesorgungstitel - wird vorgemerktInhaltsangabeIntroduction.- Power, Junction Temperature, and Reliability.- Burn-in as a Reliabili...
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